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The Imaging and Analysis Center (IAC) implements high-end, state-of-the-art instrumentation for imaging and analysis to stimulate materials research and education at Princeton . The Center is open to all students and researchers from Princeton and elsewhere (for instrument charge rates, click here).

Major instruments include:

These instruments provide high-resolution, energy-filtering and low-temperature TEM, nano-diffraction EM, nano-X-ray chemical analysis, low-voltage SEM, and in situ mechanical testing capabilities. It also has microchemical and microstructural analysis capabilities, computer simulation (molecular dynamics and image processing), and materials preparation.

Philips CM200 FEG-TEM

Philips CM200 FEG-TEM equipped with a Gatan 678 Imaging Filter and a PGT-IMIX EDX system. With a field-emission-gun, this microscope provides a point-to-point resolution of 0.2nm, and an electron probe of 0.7nm with an energy up to 200KeV. 

Zeiss 910 TEM
LEO/Zeiss 910 TEM equipped with a PGT-IMIX EDX system. This is a 100KeV electron microscope equipped with a digitally controlled eucentric 4-axis motorized side entry stage, which provides a maximum tilting angle of 60 degrees. 

FEI StrataTM DB 235 FIB
The Strata DB-235 dual-beam focused ion beam and scanning electron microscope (FIB/SEM) system. The FIB/SEM provides the unique capability in the IAC to either add or subtract material between precisely defined locations with high spatial resolution. The system is equipped with a Zyvex F100 Nanomanipulator system for in situ manipulation and testing of micro- and nanoscale samples. The F100 was recently acquired by PRISM through a special partnership with Zyvex.

FEI XL30 FEG-SEM
FEI XL30 FEG-SEM equipped with a PGT-IMIX PTS EDX system. This high-resolution field-emission SEM has an optimum image resolution of 2nm and is accessed completely using a computer terminal. The EDX system can provide X-ray acquisition to obtain high-resolution two-dimensional elemental distribution map throughout  the sample surface. 

Cameca SX 50
Cameca SX 50 electron microprobe equipped with five WDS detectors and a PGT-IMIX EDX system. This instrument can perform high precision chemical analyses using two-dimensional X-ray intensity mapping, and also imaging using secondary and back scattered electrons. 

DI Multimode AFM
DI Nanoscope IIIa Atomic Force Microscope equipped with a heating stage, fluid cell, and magnetic probe. This kind of microscope performs “imaging by touch” to image surface topography either by contact mode or “tapping” mode, either in ambient atmosphere or in a liquid environment. 

DI Dimension 3000 AFM
The Dimension 3000 is capable of atomic-scale resolution (in ideal systems). In addition to some advantages given in the multimode AFM, it can accept samples up to 100mm in diameter and can function in ambient conditions or under the surface of liquids.

Rigaku MiniFlex XRD
Rigaku MiniFlex XRD/X-ray diffractometer equipped with two types of holders (for powder and bulk) to have up to 6 samples which can be mounted and measured with the automatic sample changer. Each sample can be made to spin to enhance data precision for the qualitative and quantitative analyses. It works with JADETM 3.1 processing and search/match software.

Sample Preparation Lab
Sample preparation Lab equipped with various equipments, include: two Leica ultramicrotome instruments (ultracut UCT has cryo-capability); VCR IBS/TM250 Ion Beam Sputterer; VCR D500I Dimpler; VCR XLA 200 Ion Mill; Cressington 208 Carbon Coater; a range of ancillary items associated with sample preparation.

Computer Cluster
Center’s computer clusters provide various computer simulation capabilities: 1 SGI Octane, Sun stations, Macs, and PCs, High-resolution image scanner, MSI-Cerius2 simulation package, etc.  for molecular dynamics calculation, structural modeling and electron image and spectroscopy processing.