Manufacturer: Gaertner Scientific L3W16 Ellipsometer
Equipment: Multi-wavelength, variable angle ellipsometer
Use: Measures thickness and index of refraction of thin dielectric and polymer films on reflective substrates.
General Information and Usage
Operating Instructions and Training
Training for this and several other metrology tools may be accomplished in a single session tutorial. See the MNFL staff for details.
Contact Information for Users
For additional information regarding this machine, please contact the PRISM Staff at: MNFL-Staff@princeton.edu