Manufacturer: Gaertner Scientific L3W16 Ellipsometer
Equipment: Multi-wavelength, variable angle ellipsometer
-Measures thickness and index of refraction of thin dielectric and polymer films on reflective substrates.
Operating Instructions and Training:
Training for this and several other metrology tools may be accomplished in a single session tutorial. See the MNFL staff for details.
For additional information regarding this machine, please contact the PRISM Staff at: MNFL-Staff@princeton.edu