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Selected Recent Publications ·
B. Hekmatshoar, A. Z. Kattamis, K. Cherenack, S. Wagner and J. C.
Sturm, “Novel Amorphous-Si AMOLED Pixels with OLED-independent Turn-on
Voltage and Driving Current”, 65th Annual Device Research
Conference (DRC 2007) Conference Digest, pp. 95-96, June 2007 ·
B. Hekmatshoar, K. Long, S. Wagner and J. C. Sturm, “Analytical Model
of Apparent Threshold Voltage Lowering Induced by Contact Resistance in
Amorphous Silicon Thin Film Transistors”, 65th Annual Device
Research Conference (DRC 2007) Conference Digest, pp. 131-132,
June 2007 ·
B. Hekmatshoar, A. Z. Kattamis, K. H. Cherenack, K. Long, J-Z. Chen,
S. Wagner, J. C. Sturm, K. Rajan and M. Hack, “Reliability of Active-Matrix
Organic Light-Emitting-Diode Arrays with Amorphous Silicon Thin-Film
Transistor Backplanes on Clear Plastic”, IEEE Electron Device Letters,
vol. 29, no. 1, pp. 63-66, January 2008 ·
B. Hekmatshoar, A. Z. Kattamis, K. Cherenack, S. Wagner and J. C.
Sturm, “A Novel TFT-OLED Integration for OLED-Independent Pixel Programming
in Amorphous-Si AMOLED Pixels”, Journal of the Society for Information
Display, vol. 16, no. 1, pp. 183-188, January 2008 ·
B. Hekmatshoar, K. Cherenack, K. Long, A. Kattamis, S. Wagner and J.
C. Sturm, “AMOLED Reliability with a-Si TFT’s in Normal vs. Inverted TFT/OLED
Integration Scheme”, 66th Annual Device Research Conference (DRC
2008) Conference Digest,
pp. 243-244, June 2008 ·
B. Hekmatshoar, K. Cherenack, A. Kattamis, K. Long, S. Wagner and J.
C. Sturm, “Highly Stable Amorphous-Silicon Thin-Film Transistors on Clear
Plastic”, Applied Physics Letters, vol. 93, no. 3, pp. 032103-1-3,
July 2008 ·
B. Hekmatshoar, K. Cherenack, S. Wagner and J. C. Sturm, “Amorphous
Silicon Thin-Film Transistors with DC Saturation Current Half-Life of More
than 100 Years”, Technical Digest - 2008 IEEE International
Electron Devices Meeting (IEDM 2008) , pp. 89-92, December 2008 ·
B. Hekmatshoar, S. Wagner and J. C. Sturm, “Optimum Low-Gate-Field
and High-Gate-Field Stability of Amorphous Silicon Thin-Film Transistors with
a Single Plastic-Compatible Gate Nitride Deposition Process”, 67th Annual
Device Research Conference (DRC 2009) Conference Digest, pp. 189-190,
June 2009 Abstract (IEEE) Full Text ·
B. Hekmatshoar, S. Wagner and J. C. Sturm, “Trade-off Regimes of
Lifetime in Amorphous Silicon Thin-Film Transistors and a Universal Lifetime
Comparison Framework”, Applied Physics Letters, vol. 95, no. 14, pp. 143504-1-3, October 2009
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