Equipment
The Imaging and Analysis Center (IAC) implements high-end, state-of-the-art instrumentation for imaging and analysis to stimulate materials research and education at Princeton . The Center is open to all students and researchers from Princeton and elsewhere for instrument charge rates, click here).
- Philips CM200 FEG-TEM equipped with a Gatan 678 Imaging Filter and a PGT-IMIX EDX system.
- CM100 TEM for basic imaging and diffraction work.
- FEI XL30 FEG-SEM with an EVEX EDS, in-situ Tensil Stage, and Gatan MiniCL imaging system.
- FEI Quanta 200 FEG Environmental-SEM equipped with a peltier stage for both high and low temperature studies of wet samples. This instrument is also equipped with an integrated system for EDS, WDS and EBSD analysis.
- Cameca SX 50 electron microprobe with five WDS detectors and a PGT-IMIX EDX system.
- FEI StrataTM DB 235 FIB equipped with various attachments, including a Zyvex F100 Nanomanipulator system.
- Digital Instruments’ AFMs (both multimode and dimension) equipped with a heating stage, fluid cell, and magnetic probe.
- Rigaku MiniFlex XRD/X-Ray Diffractometer with JadeTM 3.1 processing and search/match software.
- Bruker D8 Discover X-Ray Diffractometer with various stages for heating, cooling and humidity experiments.
- Zeiss Discovery V12 Stereomicroscope with a long working distance and equipped with a 1,000 frames per second high speed camera.
- Horiba Raman Spectrometer with 460mm focal length spectrograph, including 4 gratings, computer and software, and 4 laser systems.
- Woollam M-2000 Ellipsometer equipped with a rotating compensator system with high-speed CCD detection to measure all wavelengths simultaneously.
- Sample preparation equipment, include: -two Leica ultramicrotome instruments (ultracut UCT has cryo-capability).
- Computer simulation (a cluster of computers for molecular dynamics, structure simulation, and image processing).
-VCR IBS/TM250 Ion Beam Sputterer.
-Allied Multi Prep Polisher
-Fischione 1010 Ion Mill
-Cressington 208 Carbon Coater.
-a range of ancillary items associated with sample preparation.
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Philips CM200 FEG-TEM equipped with a Gatan 678 Imaging Filter and a PGT-IMIX EDX system. With a field-emission-gun,
this microscope provides a point-to-point resolution of 0.2nm, and an electron probe of 0.7nm with an energy up to 200KeV.
 This is a 100KeV electron microscope equipped with a digitally controlled eucentric 4-axis motorized side entry stage,
which provides a maximum tilting angle of 60 degrees.
FEI XL30 FEG-SEM equipped with an EVEX EDS. in-situ Tensile Stage, and Gatan MiniCL imaging system. This high-resolution field-emission SEM has an optimum
image resolution of 2nm and is accessed completely using a computer terminal. The EDX system can provide X-ray acquisition to obtain high-resolution two-dimensional
elemental distribution map throughout the sample surface.
The Quanta 200 FEG ESEM is a special type of high performance scanning electron microscope (SEM). It is equipped with a Schottky field emission gun
(FEG) for optimal spatial resolution. The instrument can be used in high vacuum mode (HV), low-vacuum mode (LV) and the so called ESEM (Environmental SEM) mode. This makes it possible to
study samples in pressures up to 30 Torr. The microscope is equipped with a peltier stage for studies of wet samples in-situ. There are cooling and heating stages available for in-situ
experiments at temperatures ranging from -20°C up to 1500°C. This can be done in combination with having an external gas present in the chamber, e.g. air, for studying chemical reactions,
such as oxidation, at high temperatures.
Cameca SX 50 electron microprobe equipped with five WDS detectors and a PGT-IMIX EDX system. This instrument can perform high precision
chemical analyses using two-dimensional X-ray intensity mapping, and also imaging using secondary and back scattered electrons.
The Strata DB-235 dual-beam focused ion beam and scanning electron microscope (FIB/SEM) system. The FIB/SEM provides the unique capability
in the IAC to either add or subtract material between precisely defined locations with high spatial resolution. The system is equipped with a Zyvex
F100 Nanomanipulator system for in situ manipulation and testing of micro- and nanoscale samples. The F100 was recently acquired by PRISM through a special partnership with Zyvex.
DI Nanoscope IIIa Atomic Force Microscope equipped with a heating stage, fluid cell, and magnetic probe. This kind of microscope performs “imaging
by touch” to image surface topography either by contact mode or “tapping” mode, either in ambient atmosphere or in a liquid environment.
The Dimension 3000 is capable of atomic-scale resolution (in ideal systems). In addition to some advantages given in the multimode AFM,
it can accept samples up to 100mm in diameter and can function in ambient conditions or under the surface of liquids.
Rigaku MiniFlex XRD/X-ray diffractometer equipped with two types of holders for powder and bulk) to have up to 6 samples which can be mounted
and measured with the automatic sample changer. Each sample can be made to spin to enhance data precision for the qualitative and quantitative analyses. It works with JADETM 3.1
processing and search/match software.
Raman spectroscopy is a light scattering technique, and can be thought of in its simplest form as a process where a photon of light interacts with
a sample to produce scattered radiation of different wavelengths. It has become an important analytical and research tool. It can be used for applications as wide ranging
as pharmaceuticals, forensic science, polymers, thin films, semiconductors and even for the analysis of fullerene structures and carbon nano-materials.
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This XRD is a state-of-the-art, high-quality system that is easy to use, highly accurate, and versatile to meet our needs in X-ray diffraction.
This system equips with the optimum components (X-ray 4-Bounce monochromator, high-precision, two-circle goniometer, LynxEye detector and standard software package) to provide a comprehensive
solution for X-ray reflectometry, High resolution X-ray diffraction, Grazing incidence diffraction and texture measurements, as well as ?m-XRD. One of the unique advantages of this system is
its extreme versatility. The system can be easily reconfigured for the usage of multiple research groups for different applications. The combination of various measurement methods in this
single instrument allows us to use it during all phases of complex materials development. We have also added special attachments to meet our research needs. These features include:
The Discovery V12 Stereomicroscope is a configurable, modular system featuring newly patented optics for improved resolution and contrast. The
motorized zoom system provides resolution, magnification and object field data via a Human Interface Panel (HIP), which is illuminated for easy viewing. The HIP allows programmable entry
of eyepiece and objective magnification, zoom speed, focus speed, position and displays resolution, field of view and magnification values. A 3-position turret can accommodate from
0.63X to 1.5X objectives for a zoom range of 30:1.The Microscope is also equipped with a 1K frames per second high speed camera as well as integrated software for CCD image grabbing.
Images can be post processed with a wide range of image manipulating software.
Sample preparation Lab equipped with various equipments, include: two Leica ultramicrotome instruments (ultracut UCT has cryo-capability); VCR IBS/TM250
Ion Beam Sputterer; VCR D500I Dimpler; VCR XLA 200 Ion Mill; Cressington 208 Carbon Coater; a range of ancillary items associated with sample preparation.
The Leica Ultracut UCT ultramicrotome with a cryo-attachment is designed to meet the precise requirements of sample preparation for electron microscopy.
It is ideal for biological applications and soft materials preparation. It features automatic feed in 1nm increments from 1 to 100 nm. The variable cutting speed can be finitely controlled
to 0.05 mm per second. All key functions of the microtome, even the motorized approach of knife to specimen, can be operated from the separate control unit.
The MultiPrep™ System enables precise semi-automatic sample preparation of a wide range of materials for microscopic (optical, SEM, TEM, AFM, etc.)
evaluation. Capabilities include parallel polishing, precise angle polishing, site-specific polishing or any combination thereof. It provides reproducible sample results by eliminating
inconsistencies between users, regardless of their skill. The MultiPrep eliminates the need for hand-held polishing jigs, and ensures that only the sample makes contact with the abrasive.
It maintains geometric orientation of the sample relative to the abrasive plane during polishing, allowing quantification of material removal; rate of polish can be monitored, and total
amount removed can be preset.
The Model 1010 Ion Mill is a tabletop, PC-controlled precision milling and polishing system for creating high-quality TEM specimens with large electron
transparent areas. It is fully programmable and easy to use. The Model 1010 incorporates two independently adjustable, variable energy hollow anode discharge (HAD) ion sources, liquid nitrogen
specimen cooling, 0° to 45° milling angles, automatic gas control, and an oil-free vacuum system for ultra-clean specimen processing.
The M-2000® spectroscopic ellipsometer is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool.
Center’s computer clusters provide various computer simulation capabilities: 4 DELL Optiplex 780 PCs running Windows 7 64-bit with INTEL E8400 Dual Core processing, 8GB DDR3 Mem. 3 DELL Optiplex 755 PCs running Windows 7 64-bit with INTEL E6600 Dual Core processing, 8GB DDR2 Mem.
Epson V700 High-resolution image scanner.
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