Double UHV System with XPS in J109

Ultra-High Vacuum (UHV)

Ultra-Violet Photoemission Spectroscopy (UPS)

X-ray Photoemission Spectroscopy (XPS)

Low-Energy Electron Diffraction (LEED)

Auger Electron Spectroscopy (AES)

In-situ Current-Voltage Measurement (IV)

In-Situ Evaporation Growth


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STM/AFM in J109
UHV System with UPS/XPS/IPES in J311
Double UHV System in J310
AFM / EFM in N2 glove box

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