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Double UHV System with XPS in J109 |
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Ultra-High Vacuum (UHV) Ultra-Violet Photoemission Spectroscopy (UPS) X-ray Photoemission Spectroscopy (XPS) Low-Energy Electron Diffraction (LEED) Auger Electron Spectroscopy (AES) In-situ Current-Voltage Measurement (IV) In-Situ Evaporation Growth
Go to: STM/AFM in J109UHV System with UPS/XPS/IPES in J311 Double UHV System in J310 AFM / EFM in N2 glove box Return to Facilities page |