Shared Instrumentation
Electron Beam Evaporator
The electron-beam evaporator is used for depositing thin films
of various metals (Ni, Au, Ge, etc.). These are used to make ohmic
contacts or can serve as electrodes in semiconductor structures
or other materials that are being studied in PCCM projects. The
evaporator is in J414 Engineering Quadrangle, near the PRISM cleanroom.
Contact:
Mansour Shayegan
609-258-4639
shayegan@princeton.edu
Instron 8501 Servohydraulic Mechanical
Testing Apparatus
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This mechanical testing machine has been purchased jointly with
the Department of Mechanical and Aerospace Engineering for use in
undergraduate and graduate education projects as well as for some
independent work and research applications. The facility, located
in J213 of the Engineering Quadrangle, is capable of making tensile,
compression, and periodic (fatigue) tests on a wide range of materials.
As presently configured with a 100 kN load cell, 30 kN capacity
tensile grips, 100 kN compressive loading tables, and a 50 kN three
point bending jig, the equipment is best applied to metals and composite
materials. These measurements must presently be made under ambient
conditions. In addition to these standard testing configurations,
special fixtures are fabricated for making mechanical tests on components
such as spring/shock absorber assemblies or fatigue tests on bicycle
spokes. With the addition of different load cells and environmental
chambers this basic apparatus may be extended for studies of ceramics
and metals at high temperatures, or polymeric samples under different
humidity conditions and temperatures.
In order to make the equipment readily available to students and
staff, a hypertext notebook has been prepared which is available
on the web as well as on the computer dedicated to controlling the
8501. This provides a step-by-step introduction to the safe operation
of the equipment and an explanation of the functions of its components.
Data acquisition and manipulation is directly controlled from this
"Interactive Laboratory Notebook."
Contact:
Wole Soboyejo
609-258-5609
soboyejo@princeton.edu
Quantum Design MPMS SQUID Magnetometer
The SQUID magnetometer (Quantum Design) is a PCCM supported instrument
located in Jadwin Hall, Room 105. The system measures the magnetization
M of samples as a function of applied field H up to a maximum field
of 5 Tesla. In high-resolution mode, M may be measured to a resolution
of ±10-8 emu. Temperature regulation has been
improved by a recent upgrade. The temperature may be stabilized
to 0.1 K over the range 2 K to 400 K. The system may be programmed
to perform measurements overnight. Samples investigated include
magnetic materials, ceramics, novel superconductors, nanoparticles,
and spin-valve devices. While this is not a general purpose instrument,
users from other MRSECs may obtain access to the magnetometer by
special arrangement.
Contact:
Phuan Ong
609-258-4347
npo@princeton.edu
Point-Focusing Small-Angle X-Ray Scattering
(SAXS) System
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The Molecular Metrology point-focusing small-angle
x-ray scattering
(SAXS) system, in A414 Engineering Quadrangle, is capable of making
measurements on oriented or unoriented materials at scattering angles
which cover the range of Bragg spacings from 0.7 to 100 nm. This
high-resolution system is particularly well-suited to the characterization
of materials created through guided self-assembly. The instrument
employs Cu Kα1
radiation from a sealed-tube generator (PANalytical PW3830), focused
in the vertical and horizontal directions by separate, bent Si (111)
crystals. The two-dimensional multiwire Xe-filled detector is of
the Gabriel design, with a maximum count rate of 105/sec.
SAXS patterns can also be acquired on Kodak image plates. The entire
beampath is evacuated, including the large sample chambers, which
have feedthroughs to control a variety of sample environments. Sample
heating to 300oC and cooling to -10oC, as
well as temperature scanning with a Linkam DSC600 hot stage, are
presently possible.
Contact:
Richard Register
609-258-4691
register@princeton.edu
Interfacial Force Microscope (IFM)
Our Interfacial Force Microscope (IFM), located in Bowen Hall,
Room 112, is central to the experimental efforts of IRG3. The IFM,
developed at Sandia National Laboratories, employs a self-balancing
force feedback sensor allowing force profiles to be obtained while
the sensor remains rigidly stable throughout the measurement. The
IFM is capable of measuring both normal and lateral (friction) forces
simultaneously. The IFM sensor head, shown in the inset to the photo,
is mounted on a piezo tube suspended over an XYZ translation stage,
allowing precise positioning and movement of the probe tip.
Contact:
Kyle Vanderlick
609-258-4891
vandertk@princeton.edu
High Temperature Vacuum Furnace
This is a general use laboratory furnace (Materials Research Furnaces)
for heating bulk specimens to high temperatures in the absence of
air. Located in Bowen Hall Room 406, it is outfitted with a diffusion
pump to continuously evacuate the sample chamber, and is suitable
for the synthesis of metals, semiconductors, and other nonvolatile
compounds. It may also be used for treatment of nonvolatile air-sensitive
parts in a vacuum at high temperature. The furnace is supplied with
a hot-press kit for densifying refractory specimens, and also with
a crystal growth attachment. It is a unique resource for the Princeton
materials community.
Contact:
Robert Cava
609-258-0016
rcava@princeton.edu
Electrically Guided Self-Assembly
Imaging System
The dynamics of electrically guided self-assembly with colloidal
dispersions and mesoscopic silica are studied via the Zeiss Axioplan
2 and AxioCam HR imaging system located in the Engineering Quandrangle, Room G106. The Axioplan
2 can resolve 1 µm particles; the AxioCam HR provides high resolution
full-color images. To observe electric field effects on self-assembled
systems, the fully-motorized stage has been modified to accommodate
fluid cells. Specially designed image collection and processing
software enables time-lapse data collection and particle velocity
measurement. The applied potential and current can be tracked in
real time. Various attachments permit the tracking of fluorescing
particles.
Contact:
Ilhan Aksay
609-258-4394
iaksay@princeton.edu
Powder X-Ray Diffractometer
The powder X-ray diffractometer (Bruker D8
Advance) is a PCCM-supported instrument
located in the Frick Chemical Laboratory, room 114. This instrument is equipped with
a Cu X-ray tube and a diffracted beam monochromator. Collimation slits of different
widths allow for balancing diffracted beam intensity against angular resolution. An
automatic sample changer allows for preloading six samples for data acquisition.
Software for analysis of diffraction data includes the powder diffraction file for
identification of unknowns. Also included are unit cell refinement capabilities, and
crystal structure refinement employing a state-of-the-art powder profile fit method.
Contact:
Robert Cava
609 258-0016
rcava@princeton.edu
Sputtering System
The Kurt Lesker PVD 75 sputtering system, housed in
Jadwin Hall Room B8, is capable
of depositing both metallic and insulating films, depending on the sputtering target
employed. Currently, Ni, Co, Cu, Mo, Si, Ge, and permalloy targets are available. In
the past year, we have been testing and improving the system by growing Cu and MoGe
films in the range 30-400 nm.
Contact:
Phuan Ong
609-258-4347
npo@princeton.edu
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