 |
|
|
|
New Methods for Imaging Nanoscale Materials
Orientational Imaging Analysis (OIA):
An atomic force microscope (AFM) can be used to image a
diblock copolymer film at high magnifications where individual
spherical nanodomains (15 nm across) are distinguishable
(left picture), or at a much lower magnification which presents
a correspondingly larger region of the film (right). In
the right image, individual spheres are too small to resolve,
but “grains” – regions of spheres aligned
in a particular direction– appear decorated by stripes.
OIA extracts the grain orientation and boundaries from such
images, over an area up to 100 square microns.
|
IRG 2: D.E. Angelescu, C.K. Harrison, M.L. Trawick, P.M. Chaikin,
R.A. Register, and D.H. Adamson
Nanotechnology, the ability to control materials at the level of
atoms and molecules, holds promise for computing, communications
and manufacturing applications. Manipulating bits of material 1000x
smaller than the width of a human hair, however, requires new tools
that measure, probe, characterize and repair these tiny devices.
Current technologies which work at the nanoscale are blind to larger
length scales and vice versa. Needed are methods that show rich
detail at nanoscales while also seeing the larger picture. Princeton
University researchers have done just this, combining advanced microscopy
and computing in a technique called Orientational Imaging Analysis
to characterize.
Related publication [DMR-0213706]:
D.E. Angelescu, C.K. Harrison, M.L. Trawick, P.M. Chaikin, R.A.
Register, and D.H. Adamson, “Orientation Imaging Microscopy
in Two-Dimensional Crystals Via Undersampled Microscopy”,
Appl. Phys. A 78, 387 (2004).
|
|
