Topics

6/13/2002


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Table of Contents

Topics

Wires and vias

Metal migration

Metal migration problems and solutions

Diffusion wire capacitance

Depletion region capacitance

Poly/metal wire capacitance

Metal coupling capacitances

Example: parasitic capacitance measurement

Wire resistance

Mean-time-to-failure

Skin effect

Skin effect, cont’d

Skin depth

Effect on resistance

Transistor gate parasitics

Transistor source/drain parasitics

Author: Wayne Wolf

Email: wolf@princeton.edu

Home Page: http://www.ee.princeton.edu/~wolf/vlsi-book

Other information:
(c) 2002 Prentice Hall PTR

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