Topics
Boolean functions and switches
Driving switch outputs
Switching logic signals
Switch multiplexer
Charge sharing
Charge division
Charge sharing example
Charge over time
Avoiding charge sharing
Manufacturing testing
Testing and faults
Stuck-at-0/1 faults
Testing procedure
Stuck-at faults in gates
Testing single gates
Testing combinational networks
Multiple test example
Example
Stuck-at-open/closed model
Stuck-open behavior
Delay fault
Combinational network testing
Combinational testing example
Testing procedure, cont’d
Fault masking
Redundancy example
Redundancies and testing
Email: wolf@princeton.edu
Home Page: http://www.ee.princeton.edu/~wolf/vlsi-book
Other information: (c) 2002 Prentice Hall PTR
Download presentation source