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Atomic Force Microscope, AFM |
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The
atomic force microscope is a scanning probe system that measures the interatomic
force between the tip of a silicon cantilever and the sample being studied.
The Digital Instruments multimode system is illustrated, with the diagram
showing the signal generation path. |
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The
silicon tip is deflected by its interaction with the sample and the piezoelectric
sample stage is adjusted to keep the laser beam reflected off the tip in
the same region of the photodetector. In the tapping mode illustrated,
tip oscillation amplitude is kept constant. |
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